学術論文・解説記事
学術論文
paper 2017
High-resolution imaging of the silicene on Ag(111) surface by atomic force microscopy | |
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Physical Review B 96 (2017) 241302(R) |
J. Onoda, K. Yabuoshi, H. Miyazaki, and Y. Sugimoto |
Electronegativity determination of individual surface atoms by atomic force microscopy | |
Nature Communications 8 (2017) 15155 |
J. Onoda, M. Ondracek, P. Jelinek, and Y. Sugimoto |
The Local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations | |
Nanoscale 9 (2017) 5812 |
A. Yurtsever, D. Fernandez-Torre, J. Onoda, M. Abe, S. Morita, Y. Sugimoto, and R. Perez |
paper 2016
Effects of Pb intercalation on the structural and electronic properties of epitaxial graphene on SiC | |
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Small 12 (2016) 3956 |
A. Yurtsever, J. Onoda, T. Komori, T. Miyamachi, M. Abe, S. Mizuno, S. Tanaka, F. Komori, and Y. Sugimoto |
Imaging the TiO2(011)-(2x1) Surface using Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy | |
The Journal of Physical Chemistry C 120 (2016) 3390 |
A. Yurtsever, J. Onoda, M. Abe, C.L. Pang, and Y. Sugimoto |
paper 2015
Identification of Si and Ge atoms by atomic force microscopy | |
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Physical Review B 92 (2015) 155309 |
J. Onoda, K. Niki, and Y. Sugimoto |
Pt atoms adsorbed on TiO2(110)(1x1) studied with noncontact atomic force microscopy and firstprinciples simulations | |
Physical Review B 91 (2015) 075401 |
D. Fernandez-Torre, A. Yurtsever, J. Onoda, M. Abe, S. Morita, Y. Sugimoto, and R. Perez |
paper 2014
(2nx1) Reconstructions of TiO2(011) Revealed by Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy | |
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The Journal of Physical Chemistry C 118 (2014) 23168 |
C.L. Pang, A. Yurtsever, J. Onoda, Y. Sugimoto, and G. Thornton |
Subsurface Charge Repulsion of Adsorbed H-Adatoms on TiO2(110) | |
The Journal of Physical Chemistry C 118 (2014) 13674 |
J. Onoda, C.L. Pang, A. Yurtsever, and Y. Sugimoto |
Initial and secondary oxidation products on the Si(111)-(7 × 7) surface identified by atomic force microscopy and first principles calculations | |
Applied Physics Letters 104 (2014) 133107 |
J. Onoda, M. Ondracek, A. Yurtsever, P. Jelinek, and Y. Sugimoto |
paper 2012
Development of LEED Apparatus Using Nano-Tips Fabricated by Field-Assisted Etching | |
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e-Journal of Surface Science of Nanotechnology 10 (2012) 292 |
J. Onoda, T. Kanaoka, M. Kumon, and S. Mizuno |
paper 2011
Fabrication of <110> oriented tungsten nano-tips by field-assisted water etching | |
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Applied Surface Science 257 (2011) 8427 |
J. Onoda, and S. Mizuno |
paper 2010
STEM observation of tungsten tips sharpened by field-assisted oxygen etching | |
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Surface Science 604 (2010) 1094 |
J. Onoda, S. Mizuno, and H. Ago |
paper 2008
Field Emission from W Tips Sharpened by Field-Assisted Nitrogen and Oxygen Etching | |
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e-Journal of Surface Science and Nanotechnology 6 (2008) 152 |
J. Onoda, Faridur Rahman, and S. Mizuno |
Field-assisted oxygen etching for sharp field-emission tip | |
Surface Science 602 (2008) 2128 |
F. Rahman, J. Onoda, and S. Mizuno |
解説記事
2017
原子間力顕微鏡による二酸化チタン表面の研究 | |
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表面科学 38 (2017) 413 |
小野田穣,Ayhan Yurtsever,阿部真之,杉本宜昭 |
原子間力顕微鏡による単原子の電気陰性度の決定 | |
表面科学 38 (2017) 341 |
小野田穣, Martin Ondracek, Pavel Jelinek, 杉本宜昭 |
2016
非接触原子間力顕微鏡によるSiとGe原子の識別 | |
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表面科学 37 (2016) 304 |
小野田穣,仁木康平,杉本宜昭 |